Features Options/Accessories Specifications
Quantum Design Oxford - TeslatronPT

Tailored Probe Solutions for Electrical Transport Measurements

Universal Measurement Probe (UMP)

The Universal Measurement Probe is designed for a wide range of electrical transport measurements and is compatible with both TeslatronPT and TeslatronPT Plus systems. Operating over a temperature range of 1.5 – 300 K, it features a removable sample cell and interchangeable sample holders to accommodate different sample orientations relative to the magnetic field and varying numbers of electrical connections. Various wiring options are available, including DC, RF, driven guard and optical fibres, allowing configurations to be tailored to specific experimental requirements.

Universal Measurement Probe
Electrical Transport Measurements

High magnetic fields and low temperatures for hall effect and quantum hall effect measurements.

Universal Measurement Probe
Low Dimensional Physics

Investigate the effect of low temperature and high field on low dimensional materials; nanowires, nanotubes, quantum dots and 2D electron gases.

Universal Measurement Probe
Unconventional Superconductivity

Investigation of new mechanisms for superconductivity at low temperature and high field.

Features

  • Temperature Range:  1.5 – 300 K
  • Cool Down Time:  3 hours in cold variable temperature insert (VTI)
  • Sample Orientation:  parallel and perpendicular to magnetic field
  • Sample Environment:  helium exchange gas or vacuum

Why Choose Universal Measurement Probe

  • Electrically isolated from the cryostat to minimise interference and enhance measurement accuracy.
  • Experimental wiring is routed through protective tubes for effective electromagnetic interference (EMI) shielding.
  • A universal sample interface with spring-loaded electrical contacts ensures reliable and convenient connections.
  • Pre-wired with configurable options of up to 38 DC lines (19 twisted pairs), 4 RF lines, optical fibres or driven guard wiring to minimises leakage currents and capacitance, enabling more accurate, faster, low-current measurements.
  • High-thermal-conductivity ceramic sample holders feature an electrostatic discharge (ESD) protection plug for added protection.

Options / Accessories

Specifications

Wiring Options DC Wiring DC Resistance RF Wiring Optical Fibres Sample Environment Breakout Box Best For
UMP DG Wiring
(TSTP-UMP-DG-SIG)
6 shielded twisted pairs 10 Ω No No Gas / Vacuum 1 x MultiSwitch

1 x IsoSwitch/SPSU
Electric transport
12 unshielded twisted pairs 170 Ω at 300 K
UMP US Wiring
(TSTP-UMP-US-SIG)
19 unshielded twisted pairs 170 Ω at 300 K 4 Optional Gas / Vacuum 2 x IsoSwitch/SPSU RF and optical
Sample Holders LCC44-V
(TSTP-PCB-LCC44-V)
LCC44-H
(TSTP-PCB-LCC44-H)
LCC20-V
(TSTP-PCB-LCC20-V)
LCC20-H
(TSTP-PCB-LCC20-H)
DIL16-V
(TSTP-PCB-DIL16-V)
DIL16-H
(TSTP-PCB-DIL16-H)
Pins 44 44 20 20 16 16
Sample Plane Orientation Vertical Horizontal Vertical Horizontal Vertical Horizontal
Material AlN AlN AlN AlN AlN AlN
ESD Protection Plug No No Yes Yes Yes Yes
Fully Non-Magnetic Yes No No No No No
Sample Carriers LCC44
(TSTP-LCC44-5)
LCC20
(TSTP-LCC20-5)
DIL16
(TSTP-DIL16-5)
Pins 44 20 16
Material Al2O3 Al2O3 Al2O3
Sample Area 12 x 12 mm 4.0 x 4.0 mm 8.2 x 4.3 mm
Fully Non-Magnetic Yes Yes No

Comparison Table

Probe Temperature Range Cool-Down Time Sample Holder Options Line of Sight Port for Custom Wiring Best For
Basic Probe 1.5 – 300 K 2 hours No Yes Custom
Universal Measurement Probe 1.5 – 300 K 3 hours Yes No Electrical transport / RF/ Optical measurements
HelioxVT 0.3 – 300 K 5 hours Yes No Lower temperatures