The Universal Measurement Probe is designed for a wide range of electrical transport measurements and is compatible with both TeslatronPT and TeslatronPT Plus systems. Operating over a temperature range of 1.5 – 300 K, it features a removable sample cell and interchangeable sample holders to accommodate different sample orientations relative to the magnetic field and varying numbers of electrical connections. Various wiring options are available, including DC, RF, driven guard and optical fibres, allowing configurations to be tailored to specific experimental requirements.
High magnetic fields and low temperatures for hall effect and quantum hall effect measurements.
Investigate the effect of low temperature and high field on low dimensional materials; nanowires, nanotubes, quantum dots and 2D electron gases.
Investigation of new mechanisms for superconductivity at low temperature and high field.
| Wiring Options | DC Wiring | DC Resistance | RF Wiring | Optical Fibres | Sample Environment | Breakout Box | Best For |
|---|---|---|---|---|---|---|---|
| UMP DG Wiring (TSTP-UMP-DG-SIG) |
6 shielded twisted pairs | 10 Ω | No | No | Gas / Vacuum | 1 x MultiSwitch 1 x IsoSwitch/SPSU |
Electric transport |
| 12 unshielded twisted pairs | 170 Ω at 300 K | ||||||
| UMP US Wiring (TSTP-UMP-US-SIG) |
19 unshielded twisted pairs | 170 Ω at 300 K | 4 | Optional | Gas / Vacuum | 2 x IsoSwitch/SPSU | RF and optical |
| Sample Holders | LCC44-V (TSTP-PCB-LCC44-V) |
LCC44-H (TSTP-PCB-LCC44-H) |
LCC20-V (TSTP-PCB-LCC20-V) |
LCC20-H (TSTP-PCB-LCC20-H) |
DIL16-V (TSTP-PCB-DIL16-V) |
DIL16-H (TSTP-PCB-DIL16-H) |
|---|---|---|---|---|---|---|
| Pins | 44 | 44 | 20 | 20 | 16 | 16 |
| Sample Plane Orientation | Vertical | Horizontal | Vertical | Horizontal | Vertical | Horizontal |
| Material | AlN | AlN | AlN | AlN | AlN | AlN |
| ESD Protection Plug | No | No | Yes | Yes | Yes | Yes |
| Fully Non-Magnetic | Yes | No | No | No | No | No |
| Sample Carriers | LCC44 (TSTP-LCC44-5) |
LCC20 (TSTP-LCC20-5) |
DIL16 (TSTP-DIL16-5) |
|---|---|---|---|
| Pins | 44 | 20 | 16 |
| Material | Al2O3 | Al2O3 | Al2O3 |
| Sample Area | 12 x 12 mm | 4.0 x 4.0 mm | 8.2 x 4.3 mm |
| Fully Non-Magnetic | Yes | Yes | No |
| Probe | Temperature Range | Cool-Down Time | Sample Holder Options | Line of Sight Port for Custom Wiring | Best For |
|---|---|---|---|---|---|
| Basic Probe | 1.5 – 300 K | 2 hours | No | Yes | Custom |
| Universal Measurement Probe | 1.5 – 300 K | 3 hours | Yes | No | Electrical transport / RF/ Optical measurements |
| HelioxVT | 0.3 – 300 K | 5 hours | Yes | No | Lower temperatures |
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